selected publications
-
article
- Data reduction for spatially resolved reflectance anisotropy spectrometer. Review of Scientific Instruments. 94:-. 2023-01-01
- Mid-infrared optical properties of non-magnetic-metal/CoFeB/MgO heterostructures. Journal of Physics D: Applied Physics. 56:11-. 2023-01-01
- Raman study of directly synthetized graphene oxide films on Si, SiO2/Si and GaAs by remote-catalyzed CVD. Physica B: Condensed Matter. 669:-. 2023-01-01
- Reflectance anisotropies of polycrystalline Ce1-x Gdx O2-x/2/Si(001) interfaces. Applied Surface Science. 639:-. 2023-01-01
- Gait Analysis Using the Physics Toolbox App. IEEE Access. 10:31732-31739. 2022-01-01
- Optical anisotropies of asymmetric double GaAs (001) quantum wells. Physical Review B. 103:-. 2021-01-01
- Optical contrast in the near-field limit for structural characterization of graphene nanoribbons. Applied Surface Science. 536:-. 2021-01-01
- Adsorbate Isotherm Analysis by Reflection Anisotropy Spectroscopy on Copper (110) in Hydrochloric Acid. Journal of Physical Chemistry C. 124:5204-5212. 2020-01-01
- Chloride-Induced Surface States in Cu(110)/Liquid Interfaces. Journal of Physical Chemistry C. 124:25403-25411. 2020-01-01
- Crystalline Truncated Micropyramids Grown from GaAs Liquid Phase on GaP (001) Substrates. Physica Status Solidi (A) Applications and Materials Science. 217:-. 2020-01-01
- Real-time reflectance anisotropy spectroscopy of GaAs homoepitaxy. Applied Optics. 59:D39-D42. 2020-01-01
- An algorithm for the in situ analysis of optical reflectance anisotropy spectra. Journal of Crystal Growth. 515:9-15. 2019-01-01
- Determination of the layered structure of baryta based heritage photographs by infrared ellipsometry. Journal of Cultural Heritage. 36:174-182. 2019-01-01
- Differential reflectance contrast technique in near field limit: Application to graphene. AIP Advances. 9:-. 2019-01-01
- Two-dimensional electron gas in a metal/amorphous oxide interface with spin-orbit interaction. Physical Review B. 100:-. 2019-01-01
- On the origin of reflectance-anisotropy oscillations during GaAs (0 0 1) homoepitaxy. Applied Surface Science. 439:963-967. 2018-01-01
- Experimental multi-scroll attractor driven by switched systems. Revista Mexicana de Fisica. 63:117-123. 2017-01-01
- Measurements of concentration differences between liquid mixtures using digital holographic interferometry. Metrology and Measurement Systems. 24:19-26. 2017-01-01
- Note: A simple multi-channel optical system for modulation spectroscopies. Review of Scientific Instruments. 88:-. 2017-01-01
- On the emergence of islands in complex networks. Complexity. 2017:-. 2017-01-01
- Optical detection of graphene nanoribbons synthesized on stepped SiC surfaces. Journal of Applied Physics. 122:-. 2017-01-01
- Real-time reflectance-difference spectroscopy during the epitaxial growth of InAs/GaAs/(001). Applied Surface Science. 421:608-610. 2017-01-01
- Structural Characterization of a Capillary Microfluidic Chip Using Microreflectance. Applied Spectroscopy. 71:1357-1362. 2017-01-01
- Acousto-optic interaction in biconical tapered fibers: Shaping of the stopbands. Optical Engineering. 55:-. 2016-01-01
- Exciton-polariton gap soliton dynamics in moving acoustic square lattices. Physical Review B. 94:-. 2016-01-01
- Real-time measurement of the average temperature profiles in liquid cooling using digital holographic interferometry. Optical Engineering. 55:-. 2016-01-01
- Residual electric fields of InGaAs/AlAs/AlAsSb (001) coupled double quantum wells structures assessed by photoreflectance anisotropy. International Journal of Modern Physics B. 30:-. 2016-01-01
- Spatial self-organization of macroscopic quantum states of exciton-polaritons in acoustic lattices. New Journal of Physics. 18:-. 2016-01-01
- A multichannel reflectance anisotropy spectrometer for epitaxial growth monitoring. Measurement Science and Technology. 26:-. 2015-01-01
- Characterization of Si3N4/Si(111) thin films by reflectance difference spectroscopy. Japanese Journal of Applied Physics. 54:-. 2015-01-01
- On a growth model for complex networks capable of producing power-law out-degree distributions with wide range exponents. Scientific Reports. 5:-. 2015-01-01
- On the growth of directed complex networks with preferential attachment: Effect upon the prohibition of multiple links. International Journal of Modern Physics C. 26:-. 2015-01-01
- Reflectance-difference spectroscopy as a probe for semiconductor epitaxial growth monitoring. Journal of Crystal Growth. 425:21-24. 2015-01-01
- Chuas circuit and its characterization as a filter. European Journal of Physics. 35:-. 2014-01-01
- Measurement of the shear strain of the Gd2O3/GaAs(001) interface by photoreflectance difference spectroscopy. Applied Physics Letters. 105:-. 2014-01-01
- Real-time reflectance-difference spectroscopy of GaAs molecular beam epitaxy homoepitaxial growth. APL Materials. 2:-. 2014-01-01
- Optical characterization of orientation-patterned GaP structures by micro reflectance difference spectroscopy. Journal of Applied Physics. 114:-. 2013-01-01
- Reflectance anisotropies of compressively strained Si grown on vicinal Si1-xCx(001). Applied Physics Letters. 102:-. 2013-01-01
- Effects of substrate orientation on the optical anisotropy spectra of GaN/AIN/Si heterostructures in the energy range from 2.0 to 3 5ev. Journal of Applied Physics. 111:-. 2012-01-01
- MERA: A micro-economic routing algorithm for wireless sensor networks. IEICE Transactions on Communications. E95-B:2642-2645. 2012-01-01
- Micro reflectance difference techniques: Optical probes for surface exploration. Physica Status Solidi (B) Basic Research. 249:1119-1123. 2012-01-01
- Polymer-based hybrid integrated optical photochromic switch. Journal of Scientific and Industrial Research. 71:539-543. 2012-01-01
- Polarization contrast linear spectroscopies for cubic semiconductors under stress: Macro- and micro-reflectance difference spectroscopies. Annalen der Physik (Leipzig). 523:121-128. 2011-01-01
- Optical anisotropies of Si grown on step-graded SiGe(110) layers. Applied Physics Letters. 96:-. 2010-01-01
- Optical characterization of methanol adsorption on the bare and oxygen precovered Cu(1 1 0) surface. Surface Science. 604:824-828. 2010-01-01
- Microreflectance difference spectrometer based on a charge coupled device camera: Surface distribution of polishing-related linear defect density in GaAs (001). Applied Optics. 48:5713-5717. 2009-01-01
- One electron and discrete excitonic contributions to the optical response of semiconductors around E1 transition: Analysis in the reciprocal space. Journal of the Optical Society of America B: Optical Physics. 26:725-733. 2009-01-01
- Study of the molecular beam epitaxial growth of InAs on Si-covered GaAs(1 0 0) substrates. Journal of Crystal Growth. 311:1451-1455. 2009-01-01
- Effect of reconstruction-induced strain on the reflectance difference spectroscopy of GaAs (001) around E1 and E1 Δ1 transitions. Physical Review B - Condensed Matter and Materials Physics. 75:-. 2007-01-01
- Measurement of the surface strain induced by reconstructed surfaces of GaAs (001) using photoreflectance and reflectance-difference spectroscopies. Physical Review Letters. 96:-. 2006-01-01
- Strain oscillations probed with light. Physical Review Letters. 96:-. 2006-01-01
- Interfaces in Ga xIn 1-xAs ySb 1-yAl xGa 1-xAs ySb 1-ymulti- quantum-well heterostructures probed by transmittance anisotropy spectroscopy. Journal of Applied Physics. 98:-. 2005-01-01
- Origin and temperature dependence of the surface optical anisotropy on Cu(1 1 0). Surface Science. 589:153-163. 2005-01-01
- In situ monitoring of the 2D-3D growth-mode transition in In 0.3 Ga 0.7 As/GaAs (0 0 1) by reflectance-difference spectroscopy. Applied Surface Science. 221:48-52. 2004-01-01
- Reflectance difference spectroscopy of GaAs(001) under a [110] uniaxial stress. Physical Review B - Condensed Matter and Materials Physics. 70:35306-1-035306-7. 2004-01-01
- Enhanced Optical Sensitivity to Adsorption due to Depolarization of Anisotropic Surface States. Physical Review Letters. 90:4-. 2003-01-01
- Enhanced optical sensitivity to adsorption due to depolarization of anisotropic surface states. Physical Review Letters. 90:106104/1-106104/4. 2003-01-01
- Surface-induced d-band anisotropy on Cu(1 1 0). Surface Science. 527:L184-L190. 2003-01-01
- Photoreflectance-difference spectroscopy of GaAs (001) under [110] uniaxial stress: Linear and quadratic electro-optic components. Physical Review B - Condensed Matter and Materials Physics. 66:753151-753156. 2002-01-01
- Photoreflectance-difference spectroscopy of GaAs (001) under [110] uniaxial stress: Linear and quadratic electro-optic components. Physical Review B - Condensed Matter and Materials Physics. 66:1-6. 2002-01-01
- Reflectance difference spectroscopy during CdTe/ZnTe interface formation. Applied Surface Science. 190:307-310. 2002-01-01
- In situ observation of stress relaxation in CdTe/ZnTe heterostructures by reflectance-difference spectroscopy. Applied Physics Letters. 78:3615-3617. 2001-01-01
- On the origin of resonance features in reflectance difference data of silicon. Applied Surface Science. 175-176:769-776. 2001-01-01
- In situ reflectance-difference spectroscopy of doped CdTe and ZnTe grown by molecular beam epitaxy. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 18:2224-2228. 2000-01-01
- Linear electro-optic reflectance modulated spectra of GaAs (001) around E1 and E1 Δ1. Thin Solid Films. 373:207-210. 2000-01-01
- Surface-stress-induced optical bulk anisotropy. Physical Review B - Condensed Matter and Materials Physics. 62:13048-13052. 2000-01-01
- Linear electro-optic photoreflectance spectra of GaAs and CdTe around E1 and E1 Δ1. Physica Status Solidi (A) Applied Research. 175:45-50. 1999-01-01
- Photoreflectance spectroscopy of CdTe(001) around E1 and E1 Δ1: Linear electro-optic spectrum. Journal of Applied Physics. 86:2062-2065. 1999-01-01
- Optical electromodulation of surface-intrinsic-doped structures. Journal of Applied Physics. 82:5072-5076. 1997-01-01
- A spectrometer for the measurement of reflectance-difference spectra. Review of Scientific Instruments. 64:2147-2152. 1993-01-01
-
conference paper
- Rapid reflectance-anisotropy spectroscopy as an optical probe for real-time monitoring of thin film deposition. AIP Conference Proceedings. -. 2018-01-01
- Real-time optical monitoring of semiconductor epitaxial growth. AIP Conference Proceedings. -. 2018-01-01
- Design of double-tapered fibers for tailoring the acoustooptic spectral response. Optics InfoBase Conference Papers. -. 2016-01-01
- Dynamical and tuneable modulation of the Tamm plasmon/exciton-polariton hybrid states using surface acoustic waves. Acta Physica Polonica A. A26-A29. 2016-01-01
- Measurement of change in refractive index in Au/PET using digital holographic interferometry. Latin America Optics and Photonics Conference, LAOP 2014. -. 2014-01-01
- Real-time reflectance anisotropy spectroscopy of MBE AlAs/GaAs interfaces. Latin America Optics and Photonics Conference, LAOP 2014. -. 2014-01-01
- A rapid reflectance-difference spectrometer for real-time semiconductor growth monitoring with sub-second time resolution. Review of Scientific Instruments. -. 2012-01-01
- Optical waveguide writing in photochromic material: Photoinduced optical properties by femtosecond laser pulses. Proceedings of SPIE - The International Society for Optical Engineering. -. 2011-01-01
- Dots-in-a-well InGaAs based laser probed by photoreflectance-anisotropy spectroscopy. IEEExPO 2009 - 3rd Conference of University of Guanajuato IEEE Students Chapter. 8-11. 2009-01-01
- Optical anisotropy induced by mechanical strain around the fundamental gap of GaAs. Physica Status Solidi (C) Current Topics in Solid State Physics. 2561-2564. 2008-01-01
- Reflectance-anisotropy study of the dynamics of molecular beam epitaxy growth of GaAs and InGaAs on GaAs (001). Physica Status Solidi (C) Current Topics in Solid State Physics. 2573-2577. 2008-01-01
- Reflectance-difference spectroscopy as an optical probe for in situ determination of doping levels in GaAs. Physica Status Solidi (C) Current Topics in Solid State Physics. 2565-2568. 2008-01-01
- Surface strain contributions to the lineshapes of reflectance difference spectra for one-electron and discrete-exciton transitions. Physica Status Solidi (C) Current Topics in Solid State Physics. 2591-2594. 2008-01-01
- Reconstruction induced surface strain in GaAs (001) surfaces characterized by reflectance modulated spectroscopies. AIP Conference Proceedings. 11-12. 2007-01-01
- Reflectance difference spectrometer based on the use of a CCD camera. Proceedings of SPIE - The International Society for Optical Engineering. -. 2007-01-01
- Reflectance-difference Spectroscopy as an optical probe for the in situ determination of doping levels in GaAs. Proceedings of SPIE - The International Society for Optical Engineering. -. 2007-01-01
- FPGA-based educational platform for wireless transmission using system generator. Proceedings of the 2006 IEEE International Conference on Reconfigurable Computing and FPGA's, ReConFig 2006. 304-312. 2006-01-01
- Reflectance difference spectroscopy as an optical probe for the in situ determination of doping levels in gaas. Multiconference on Electronics and Photonics, MEP 2006. 4-7. 2006-01-01
- Growth of self-assembled InAs quantum dots on Si exposed GaAs substrates by molecular beam epitaxy. Journal of Crystal Growth. 201-207. 2003-01-01
- In situ optical monitoring of the interface strain relaxation of InGaAs/GaAs grown by molecular-beam epitaxy. Physica Status Solidi C: Conferences. 3017-3021. 2003-01-01
- Model for the strain-induced reflectance-difference spectra of InGaAs/GaAs (001) epitaxial layers. Physica Status Solidi C: Conferences. 2987-2991. 2003-01-01
- RDS investigation of adsorption and surface ordering processes on Cu(110). Physica Status Solidi C: Conferences. 3022-3026. 2003-01-01
- Strain induced optical anisotropies in zincblende semiconductors. Physica Status Solidi (B) Basic Research. 500-508. 2003-01-01
- Surface dynamics during MBE growth of GaAs(001) monitored by in-situ reflectance difference spectroscopy. Physica Status Solidi C: Conferences. 3012-3016. 2003-01-01
- Collective dimer stress induced dichroism in II-VI semiconductors. Physica Status Solidi (B) Basic Research. 155-159. 2002-01-01
- In situ optical techniques for monitoring the formation of nanostructures. Physica Status Solidi (B) Basic Research. 13-23. 2002-01-01
- Influence of anisotropic in-plane strain on critical point resonances in reflectance difference data. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 1650-1657. 2001-01-01
- Effect of surface states on the electrical properties of MBE grown modulation doped AlGaAs/GaAs. Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. -. 2014-01-01
- Stress-induced optical anisotropies measured by modulated reflectance. Semiconductor Science and Technology. R35-R46. 2004-01-01