abstract

• We report photoreflectance-difference and reflectance-difference measurements on reconstructed GaAs (001) surfaces. From these data the linear and quadratic electro-optic coefficient spectra are determined in the important 2.8-3.4 eV spectral region. The surface strain and fields induced by the surface reconstruction are also determined. We show experimentally that between c(4×4) and (2×4) surfaces, there is an inversion of the surface electric field which we attribute to a direct piezo-electric effect related to the surface strain induced by reconstruction. © 2006 The American Physical Society.

authors

• Balderas Navarro Raúl Eduardo
• Cardona M.
• Flores Camacho José Manuel
• Lastras Martínez Alfonso
• Lastras Martínez Luis Felipe

publication date

• 2006-01-01

published in

• Physical Review Letters  Journal

keywords

• Electric field effects; Electrooptical effects; Piezoelectricity; Strain; Electro-optic coefficient; Surface reconstruction; Surface strain; Gallium compounds

Digital Object Identifier (DOI)

• 10.1103/PhysRevLett.96.047402

start page

end page

volume

• 96

issue

• 4