selected publications

• article

  • Adsorbate Isotherm Analysis by Reflection Anisotropy Spectroscopy on Copper (110) in Hydrochloric Acid.  Journal of Physical Chemistry C.  124:5204-5212. 2020-01-01
  • Chloride-Induced Surface States in Cu(110)/Liquid Interfaces.  Journal of Physical Chemistry C.  124:25403-25411. 2020-01-01
  • Reflectance anisotropies of compressively strained Si grown on vicinal Si1-xCx(001).  Applied Physics Letters.  102:-. 2013-01-01
  • One electron and discrete excitonic contributions to the optical response of semiconductors around E1 transition: Analysis in the reciprocal space.  Journal of the Optical Society of America B: Optical Physics.  26:725-733. 2009-01-01
  • Strain oscillations probed with light.  Physical Review Letters.  96:-. 2006-01-01
  • Enhanced Optical Sensitivity to Adsorption due to Depolarization of Anisotropic Surface States.  Physical Review Letters.  90:4-. 2003-01-01
  • Enhanced optical sensitivity to adsorption due to depolarization of anisotropic surface states.  Physical Review Letters.  90:106104/1-106104/4. 2003-01-01
  • Surface-induced d-band anisotropy on Cu(1 1 0).  Surface Science.  527:L184-L190. 2003-01-01
  • Reflectance difference spectroscopy during CdTe/ZnTe interface formation.  Applied Surface Science.  190:307-310. 2002-01-01
  • In situ observation of stress relaxation in CdTe/ZnTe heterostructures by reflectance-difference spectroscopy.  Applied Physics Letters.  78:3615-3617. 2001-01-01
  • On the origin of resonance features in reflectance difference data of silicon.  Applied Surface Science.  175-176:769-776. 2001-01-01
  • In situ reflectance-difference spectroscopy of doped CdTe and ZnTe grown by molecular beam epitaxy.  Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures.  18:2224-2228. 2000-01-01
  • Surface-stress-induced optical bulk anisotropy.  Physical Review B - Condensed Matter and Materials Physics.  62:13048-13052. 2000-01-01

• conference paper

  • Collective dimer stress induced dichroism in II-VI semiconductors.  Physica Status Solidi (B) Basic Research. 155-159. 2002-01-01
  • In situ optical techniques for monitoring the formation of nanostructures.  Physica Status Solidi (B) Basic Research. 13-23. 2002-01-01
  • Influence of anisotropic in-plane strain on critical point resonances in reflectance difference data.  Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 1650-1657. 2001-01-01
• Stress-induced optical anisotropies measured by modulated reflectance.  Semiconductor Science and Technology. R35-R46. 2004-01-01