Characterization; High electron mobility transistors; Molecular beam epitaxy; Photoreflectance Aluminum gallium arsenide; Characterization; Electric currents; Electric fields; Electric potential; Electron gas; Electron mobility; Electrons; Hall mobility; Modulation; Molecular beam epitaxy; Power HEMT; Semiconducting aluminum compounds; Two dimensional electron gas; Franz-Keldysh oscillations; Hall effect measurement; Internal electric fields; Modulation wavelength; Photoreflectance; Photoreflectance spectroscopy; Surface electric fields; Surface electric potentials; High electron mobility transistors