Self-assembling conditions of 4C10Sn nanoclusters in Ge:(C, Sn)
Article
-
- Overview
-
- Research
-
- Identity
-
- Additional Document Info
-
- View All
-
Overview
abstract
-
Phase diagram of Ge:(C, Sn) describing the self-assembling conditions of 4C10Sn nanoclusters is represented. The smaller lattice strains caused by the isoelectronic impurity nanoclusters in comparison with the strains produced by isolated impurities are a reason of self-assembling. Occurrence of nanoclusters should be a result of continuous phase transition. At the carbon and Sn contents equal to 0.01 and 0.025, respectively, the fractions of Sn atoms situated in nanoclusters are 0.85 and 0.32 at 500 and 800 °C, respectively. At the bulk crystallization temperature of Ge self-assembling is insignificant. © 2009 Elsevier B.V. All rights reserved.
publication date
published in
Research
keywords
-
Impurities; Nanoclusters; Self-assembling Bulk crystallization; Continuous phase transitions; Isoelectronic impurities; Lattice strain; Self-assembling; Germanium; Impurities; Phase diagrams; Phase transitions; Tin; Nanoclusters
Identity
Digital Object Identifier (DOI)
Additional Document Info
start page
end page
volume
issue