selected publications
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article
- Reflectance difference spectroscopy during CdTe/ZnTe interface formation. Applied Surface Science. 190:307-310. 2002-01-01
- In situ observation of stress relaxation in CdTe/ZnTe heterostructures by reflectance-difference spectroscopy. Applied Physics Letters. 78:3615-3617. 2001-01-01
- On the origin of resonance features in reflectance difference data of silicon. Applied Surface Science. 175-176:769-776. 2001-01-01
- In situ reflectance-difference spectroscopy of doped CdTe and ZnTe grown by molecular beam epitaxy. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 18:2224-2228. 2000-01-01
- Surface-stress-induced optical bulk anisotropy. Physical Review B - Condensed Matter and Materials Physics. 62:13048-13052. 2000-01-01
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conference paper
- Collective dimer stress induced dichroism in II-VI semiconductors. Physica Status Solidi (B) Basic Research. 155-159. 2002-01-01
- In situ optical techniques for monitoring the formation of nanostructures. Physica Status Solidi (B) Basic Research. 13-23. 2002-01-01
- Influence of anisotropic in-plane strain on critical point resonances in reflectance difference data. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 1650-1657. 2001-01-01