Si substrate treatment with nitrogen for molecular beam epitaxial growth of ZnSe
Article
Overview
Research
Identity
Additional Document Info
View All
Overview
abstract
The authors have achieved a substantial improvement in the ZnSe molecular beam epitaxy of Si(111) by irradiating the substrate surface with a flux of nitrogen free radicals (N *) prior to growth. This new substrate treatment induced an initial two-dimensional growth as revealed by reflection high-energy electron diffraction, Auger electron spectroscopy, and atomic force microscopy. The improved epitaxy was confirmed by high resolution x-ray diffraction.
Atomic force microscopy; Auger electron spectroscopy; Free radicals; Molecular beam epitaxy; Nitrogen; Reflection high energy electron diffraction; Semiconducting zinc compounds; Surface treatment; X ray diffraction analysis; Two-dimensional growth; Silicon wafers