abstract

• Detectors, photo-emitter, and other high order radiation devices work under the principle of directionality to enhance the power of emission/transmission in a particular direction. In order to understand such directionality, it is important to study their coupling mechanism of their active elements. In this work, we present a crystalline orientation analysis of ZnO nanorods grown epitaxially on the pentagonal faces of silver nanowires. The analysis of the crystalline orientation at the metal-semiconductor interface (ZnO/Ag) is performed with precession electron diffraction under assisted scanning mode. In addition, high resolution X-ray diffraction on a Bragg-Brentano configuration has been used to identify the crystalline phases of the arrangement between ZnO rods and silver nanowires. The work presented herein provides a fundamental knowledge to understand the metal-semiconductor behavior related to the receiving/transmitting mechanisms of ZnO/Ag nanoantennas. © 2016 Author(s).

authors

• Benitez A.
• González Contreras Francisco Javier
• José-Yacamán M.
• Ponce A.
• Sanchez J.E.
• Santiago U.

publication date

• 2016-01-01

published in

• Applied Physics Letters  Journal

keywords

• Crystalline materials; Electric resistance measurement; II-VI semiconductors; Image enhancement; Magnetic semiconductors; Nanoantennas; Nanorods; Nanowires; Oxide semiconductors; Silver; Wide band gap semiconductors; X ray diffraction; Zinc oxide; Coupling mechanism; Crystalline orientations; Crystalline phasis; Epitaxial interfaces; High resolution X ray diffraction; Metal semiconductor interface; Metal semiconductors; Precession electron diffractions; Metal analysis

Digital Object Identifier (DOI)

• 10.1063/1.4964719

start page

end page

volume

• 109

issue

• 15