selected publications

• article

  • Reflectance difference spectroscopy during CdTe/ZnTe interface formation.  Applied Surface Science.  190:307-310. 2002-01-01
  • In situ observation of stress relaxation in CdTe/ZnTe heterostructures by reflectance-difference spectroscopy.  Applied Physics Letters.  78:3615-3617. 2001-01-01
  • In situ reflectance-difference spectroscopy of doped CdTe and ZnTe grown by molecular beam epitaxy.  Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures.  18:2224-2228. 2000-01-01
  • Investigation of the structural properties of MBE grown ZnSe/GaAs heterostructures.  Journal of Crystal Growth.  175-176:571-576. 1997-01-01
  • Optical and structural properties of ZnSe/GaAs interfaces.  Applied Surface Science.  112:165-170. 1997-01-01

• conference paper

  • Collective dimer stress induced dichroism in II-VI semiconductors.  Physica Status Solidi (B) Basic Research. 155-159. 2002-01-01