selected publications

• article

  • Optical contrast in the near-field limit for structural characterization of graphene nanoribbons.  Applied Surface Science.  536:-. 2021-01-01
  • TO-phonon anisotropies in a highly doped InP (001) grating structure.  Applied Physics Letters.  119:-. 2021-01-01
  • Real-time reflectance anisotropy spectroscopy of GaAs homoepitaxy.  Applied Optics.  59:D39-D42. 2020-01-01
  • Temperature-dependent infrared ellipsometry of Mo-doped VO2 thin films across the insulator to metal transition.  Scientific Reports.  10:-. 2020-01-01
  • An algorithm for the in situ analysis of optical reflectance anisotropy spectra.  Journal of Crystal Growth.  515:9-15. 2019-01-01
  • Differential reflectance contrast technique in near field limit: Application to graphene.  AIP Advances.  9:-. 2019-01-01
  • On the origin of reflectance-anisotropy oscillations during GaAs (0 0 1) homoepitaxy.  Applied Surface Science.  439:963-967. 2018-01-01
  • Reflectivity of 1D photonic crystals: A comparison of computational schemes with experimental results.  International Journal of Modern Physics B.  32:-. 2018-01-01
  • Microscopic optical anisotropy of exciton-polaritons in a GaAs-based semiconductor microcavity.  Physical Review B.  96:-. 2017-01-01
  • Note: A simple multi-channel optical system for modulation spectroscopies.  Review of Scientific Instruments.  88:-. 2017-01-01
  • Optical detection of graphene nanoribbons synthesized on stepped SiC surfaces.  Journal of Applied Physics.  122:-. 2017-01-01
  • Structural Characterization of a Capillary Microfluidic Chip Using Microreflectance.  Applied Spectroscopy.  71:1357-1362. 2017-01-01
  • Residual electric fields of InGaAs/AlAs/AlAsSb (001) coupled double quantum wells structures assessed by photoreflectance anisotropy.  International Journal of Modern Physics B.  30:-. 2016-01-01
  • Polarization contrast linear spectroscopies for cubic semiconductors under stress: Macro- and micro-reflectance difference spectroscopies.  Annalen der Physik (Leipzig).  523:121-128. 2011-01-01
  • Optical anisotropies of Si grown on step-graded SiGe(110) layers.  Applied Physics Letters.  96:-. 2010-01-01
  • Microreflectance difference spectrometer based on a charge coupled device camera: Surface distribution of polishing-related linear defect density in GaAs (001).  Applied Optics.  48:5713-5717. 2009-01-01

• conference paper

  • Reflectance difference spectrometer based on the use of a CCD camera.  Proceedings of SPIE - The International Society for Optical Engineering. -. 2007-01-01