selected publications
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article
- Optical contrast in the near-field limit for structural characterization of graphene nanoribbons. Applied Surface Science. 536:-. 2021-01-01
- TO-phonon anisotropies in a highly doped InP (001) grating structure. Applied Physics Letters. 119:-. 2021-01-01
- Real-time reflectance anisotropy spectroscopy of GaAs homoepitaxy. Applied Optics. 59:D39-D42. 2020-01-01
- Temperature-dependent infrared ellipsometry of Mo-doped VO2 thin films across the insulator to metal transition. Scientific Reports. 10:-. 2020-01-01
- An algorithm for the in situ analysis of optical reflectance anisotropy spectra. Journal of Crystal Growth. 515:9-15. 2019-01-01
- Differential reflectance contrast technique in near field limit: Application to graphene. AIP Advances. 9:-. 2019-01-01
- On the origin of reflectance-anisotropy oscillations during GaAs (0 0 1) homoepitaxy. Applied Surface Science. 439:963-967. 2018-01-01
- Reflectivity of 1D photonic crystals: A comparison of computational schemes with experimental results. International Journal of Modern Physics B. 32:-. 2018-01-01
- Microscopic optical anisotropy of exciton-polaritons in a GaAs-based semiconductor microcavity. Physical Review B. 96:-. 2017-01-01
- Note: A simple multi-channel optical system for modulation spectroscopies. Review of Scientific Instruments. 88:-. 2017-01-01
- Optical detection of graphene nanoribbons synthesized on stepped SiC surfaces. Journal of Applied Physics. 122:-. 2017-01-01
- Structural Characterization of a Capillary Microfluidic Chip Using Microreflectance. Applied Spectroscopy. 71:1357-1362. 2017-01-01
- Residual electric fields of InGaAs/AlAs/AlAsSb (001) coupled double quantum wells structures assessed by photoreflectance anisotropy. International Journal of Modern Physics B. 30:-. 2016-01-01
- Polarization contrast linear spectroscopies for cubic semiconductors under stress: Macro- and micro-reflectance difference spectroscopies. Annalen der Physik (Leipzig). 523:121-128. 2011-01-01
- Optical anisotropies of Si grown on step-graded SiGe(110) layers. Applied Physics Letters. 96:-. 2010-01-01
- Microreflectance difference spectrometer based on a charge coupled device camera: Surface distribution of polishing-related linear defect density in GaAs (001). Applied Optics. 48:5713-5717. 2009-01-01
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conference paper
- Reflectance difference spectrometer based on the use of a CCD camera. Proceedings of SPIE - The International Society for Optical Engineering. -. 2007-01-01