abstract

• We report the theoretical comparison of the omnidirectional photonic bandgap (OPBG) of one-dimensional dielectric photonic structures, using three different refractive index profiles: sinusoidal, Gaussian, and Bragg. For different values of physical thickness (PT) and optical thickness (OT), the tunability of the OPBG of each profile is shown to depend on the maximum/minimum refractive indices. With an increase in the value of the maximum refractive index, the structures with the same PT showed a linear increment of the OPBG, in contrast to the structures with the same OT, showing an optimal combination of refractive indices for each structure to generate the maximum OPBG. An experimental verification was carried out with a multilayered dielectric porous silicon structure for all the three profiles. © 2012 Ariza-Flores et al.

authors

• Agarwal V.
• Ariza Flores Augusto David
• Gaggero-Sager L.M.

publication date

• 2012-01-01

funding provided via

• Consejo Nacional de Ciencia y Tecnología, CONACYT: 128953, 39986  Grant

published in

• Nanoscale Research Letters  Journal

keywords

• Dielectric mirrors; Multilayered mirrors; Omnidirectional mirrors; Porous silicon Energy gap; Mirrors; Refractive index; Spontaneous emission; Dielectric mirrors; Experimental verification; Multi-layered; Omnidirectional mirrors; Optimal combination; Physical thickness; Porous silicon structures; Refractive index profiles; Porous silicon

Digital Object Identifier (DOI)

• 10.1186/1556-276X-7-391

start page

end page

volume

• 7