selected publications

• article

  • Microscopic optical anisotropy of exciton-polaritons in a GaAs-based semiconductor microcavity.  Physical Review B.  96:-. 2017-01-01
  • Structural Characterization of a Capillary Microfluidic Chip Using Microreflectance.  Applied Spectroscopy.  71:1357-1362. 2017-01-01
  • Residual electric fields of InGaAs/AlAs/AlAsSb (001) coupled double quantum wells structures assessed by photoreflectance anisotropy.  International Journal of Modern Physics B.  30:-. 2016-01-01
  • Characterization of Si3N4/Si(111) thin films by reflectance difference spectroscopy.  Japanese Journal of Applied Physics.  54:-. 2015-01-01
  • Measurement of the shear strain of the Gd2O3/GaAs(001) interface by photoreflectance difference spectroscopy.  Applied Physics Letters.  105:-. 2014-01-01
  • Optical characterization of orientation-patterned GaP structures by micro reflectance difference spectroscopy.  Journal of Applied Physics.  114:-. 2013-01-01
  • Effects of substrate orientation on the optical anisotropy spectra of GaN/AIN/Si heterostructures in the energy range from 2.0 to 3 5ev.  Journal of Applied Physics.  111:-. 2012-01-01
  • Micro reflectance difference techniques: Optical probes for surface exploration.  Physica Status Solidi (B) Basic Research.  249:1119-1123. 2012-01-01
  • Polarization contrast linear spectroscopies for cubic semiconductors under stress: Macro- and micro-reflectance difference spectroscopies.  Annalen der Physik (Leipzig).  523:121-128. 2011-01-01