selected publications

• article

  • Photothermal ionisation spectroscopy of oxygen-related shallow defects in crystalline silicon.  Applied Physics A Solids and Surfaces.  48:41-47. 1989-01-01
  • High sensitivity detection of trace impurities in the presence of other impurity species: The shallow thermal donors in Cz-Silicon.  Mikrochimica Acta.  94:415-418. 1988-01-01
  • New oxygen related shallow thermal donor centres in Czochralski-grown silicon.  Solid State Communications.  58:151-155. 1986-01-01