selected publications
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conference paper
- Dependence on the growth direction of the strain in AlGaSb alloys. Journal of Physics: Conference Series. -. 2009-01-01
- Raman and FTIR spectroscopy of GaSb and AlxGa1-X alloys with nanometric thickness grown at low temperatures by liquid phase epitaxy. AIP Conference Proceedings. 1258-1261. 2008-01-01
- AFM and FTIR characterization of microcrystalline Si obtained from isothermal annealing of Al/a-Si:H. Physica Status Solidi (A) Applications and Materials Science. 1014-1017. 2007-01-01
- Structural characterization of microcrystalline-amorphous hydrogenated silicon samples prepared by PECVD method. Proceedings of SPIE - The International Society for Optical Engineering. 1540-1543. 2004-01-01