selected publications

• article

  • Temperature determination by solubility measurements and a study of evaporation of volatile components in LPE.  Thin Solid Films.  340:24-27. 1999-01-01
  • A new LPE growth method of semiconductor heterostructures with thickness profile variation of epitaxial layers.  Journal of Electronic Materials.  27:1003-1004. 1998-01-01
  • Obtención e investigación de heteroestucturas láser InGaAsP/GaAs e InGaAsP/InP con emisión de onda de 0.8 μm y 1.3 μm.  Revista Mexicana de Fisica.  44:282-289. 1998-01-01