Study of the electrical and physical properties of the CdS/ZnS n-n homopolar junction synthesized by SILAR
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We report SnO2, CdS, and ZnS multilayer thin films structure synthesized on glass substrates using the SILAR method to produce an n-n homopolar junction as an emitter layer. A reaction mechanism is proposed to explain the several interactions between the precursors on each film layer. Scanning electron microscopy, Raman spectroscopy, and Grazing incidence X-ray diffraction determinate a polycrystalline nature, uniform substrate coverage, and a reasonable number of imperfections. The optical transmittance data obtained in addition with the I-V curve analysis give necessary information about optoelectrical properties of the material growth made on the substrate as a n-n homopolar junction.