Preparation and characterization of Cr-O films grown by low-temperature chemical vapor deposition
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The preparation of chromium oxide films was investigated using the chemical vapor deposition (CVD) process in order to improve the corrosion resistance of 304 stainless steel in a chloride environment. The compounds Cr(CO)6 and Cr(C7H5O2)3 were used as precursors which have low decomposition temperature (below 473 K). The deposition temperatures explored for Cr(CO)6 precursor were from 496 to 753 K and the total pressure were controlled from 0.1 to 1.0 torr. The deposition temperatures for the Cr(C7H5O2)3 precursor were from 673 to 933 K and the pressures were from 50 to 585 torr. Ultra high pure oxygen gas was added into the deposition chamber to help the formation of a specific CrxOy film. Morphological characterization of the films was performed by X-ray diffraction (XRD), scanning (SEM) and transmission (TEM) electron microscopies. SEM and TEM results showed that most of the films have a columnar structure with small agglomerated particles (below 100 nm) on the surface. The films thickness varied from 2 to 8 μm. The XRD results made evident that the films prepared from Cr(C7H5O2)3 precursor consist of CrO and Cr2O5, in contrast, the films prepared using Cr(CO)6 precursor consists of Cr2O3. The corrosion resistance study of the chromium oxide films is still in progress.
Chemical vapor deposition CVD; Chromium oxide films; Corrosion Agglomeration; Chemical vapor deposition; Corrosion resistance; Film growth; Film preparation; Low temperature effects; Morphology; Pressure control; Scanning electron microscopy; Stainless steel; Transmission electron microscopy; X ray diffraction analysis; Chromium oxide; Columnar structure; Deposition temperatures; Film thickness; Morphological characterization; Precursor; Chromium compounds