Optical characterization of vacuum evaporated cadmium sulfide films
Article
-
- Overview
-
- Research
-
- Identity
-
- Additional Document Info
-
- View All
-
Overview
abstract
-
The optical constants (n,k) of cadmium sulfide (CdS) thin films were determined in the spectral range of 0.55 μm to 1.80 μm from the optical absorption and transmittance measurements. The optical band gap (Eg) was determined for the films deposited at different substrate temperatures. Scanning electron microscopy (SEM), energy dispersive X-ray (EDX) analysis and X-ray diffraction (XRD) techniques were used to determine the morphology, composition, crystalline structure and crystallite size of the films. Evaporated CdS films show a predominant hexagonal phase with small crystallites. The optical band gap values of the films varied from 2.38 to 2.41 eV depending on the substrate temperature. It has been observed that the band gap and refractive index of the films have a close relationship with the size of the crystallites. The lower estimated value of band gap of the films is explained considering the effects of excitons and (or) some impurities. © 1997 Elsevier Science S.A.
publication date
funding provided via
published in
Research
keywords
-
Cadmium sulphide; Evaporation; Optical properties Crystal structure; Energy gap; Evaporation; Excitons; Light absorption; Light transmission; Morphology; Refractive index; Semiconducting cadmium compounds; Thermal effects; Thin films; Vacuum applications; Cadmium sulfide; Energy dispersive X ray analysis (EDX); Semiconducting films
Identity
Digital Object Identifier (DOI)
Additional Document Info
start page
end page
volume
issue