In situ TEM measurements; Mechanical deformation; Silver nanowires; Transmission electron microscopy Atomic force microscopy; Bending (deformation); Electric resistance measurement; Electron microscopy; Fracture toughness; High resolution transmission electron microscopy; In situ processing; Nanowires; Silver; Transmission electron microscopy; Transmissions; Elastic and plastic deformation; In-situ TEM; In-situ transmission electron microscopies; Mechanical deformation; Real time; Silver nanowires; Fracture