A Fast Implementation for the Typical Testor Property Identification Based on an Accumulative Binary Tuple

In this paper, we introduce a fast implementation of the CT EXT algorithm for testor property identification, that is based on an accumulative binary tuple. The fast implementation of the CT EXT algorithm (one of the fastest algorithms reported), is designed to generate all the typical testors from a training matrix, requiring a reduced number of operations. Experimental results using this fast implementation and the comparison with other state-of-the-art algorithms that generate typical testors are presented. © 2012 Copyright the authors.

feature selection; logical combinatorial pattern recognition; pattern recognition; tipycal testors Fast implementation; Property identification; State-of-the-art algorithms; tipycal testors; Feature extraction; Pattern recognition; Algorithms

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