selected publications

• article

  • Reflectance difference spectroscopy during CdTe/ZnTe interface formation.  Applied Surface Science.  190:307-310. 2002-01-01
  • In situ observation of stress relaxation in CdTe/ZnTe heterostructures by reflectance-difference spectroscopy.  Applied Physics Letters.  78:3615-3617. 2001-01-01
  • On the origin of resonance features in reflectance difference data of silicon.  Applied Surface Science.  175-176:769-776. 2001-01-01
  • In situ reflectance-difference spectroscopy of doped CdTe and ZnTe grown by molecular beam epitaxy.  Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures.  18:2224-2228. 2000-01-01
  • Surface-stress-induced optical bulk anisotropy.  Physical Review B - Condensed Matter and Materials Physics.  62:13048-13052. 2000-01-01

• conference paper

  • Collective dimer stress induced dichroism in II-VI semiconductors.  Physica Status Solidi (B) Basic Research. 155-159. 2002-01-01
  • In situ optical techniques for monitoring the formation of nanostructures.  Physica Status Solidi (B) Basic Research. 13-23. 2002-01-01
  • Influence of anisotropic in-plane strain on critical point resonances in reflectance difference data.  Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 1650-1657. 2001-01-01