selected publications

• conference paper

  • Dependence on the growth direction of the strain in AlGaSb alloys.  Journal of Physics: Conference Series. -. 2009-01-01
  • Raman and FTIR spectroscopy of GaSb and AlxGa1-X alloys with nanometric thickness grown at low temperatures by liquid phase epitaxy.  AIP Conference Proceedings. 1258-1261. 2008-01-01
  • AFM and FTIR characterization of microcrystalline Si obtained from isothermal annealing of Al/a-Si:H.  Physica Status Solidi (A) Applications and Materials Science. 1014-1017. 2007-01-01
  • Structural characterization of microcrystalline-amorphous hydrogenated silicon samples prepared by PECVD method.  Proceedings of SPIE - The International Society for Optical Engineering. 1540-1543. 2004-01-01