selected publications

• article

  • Raman studies of aluminum induced microcrystallization of n Si:H films produced by PECVD.  Thin Solid Films.  445:32-37. 2003-01-01

• conference paper

  • Structural characterization of microcrystalline-amorphous hydrogenated silicon samples prepared by PECVD method.  Proceedings of SPIE - The International Society for Optical Engineering. 1540-1543. 2004-01-01