selected publications

• article

  • Real-time reflectance-difference spectroscopy during the epitaxial growth of InAs/GaAs/(001).  Applied Surface Science.  421:608-610. 2017-01-01

• conference paper

  • A rapid reflectance-difference spectrometer for real-time semiconductor growth monitoring with sub-second time resolution.  Review of Scientific Instruments. -. 2012-01-01