abstract

• We present the viability of obtaining the particle size and surface coverage in a monolayer of polystyrene particles adsorbed on a glass surface from optical coherent reflectance data around the critical angle in an internal reflection configuration. We have found that fitting a CSM to optical reflectivity curves in an internal reflection configuration around the critical angle with a dilute random monolayer of particles adsorbed on the surface can in fact provide the particle%27s radius and surface coverage once the particles are sufficiently large. © 2009 SPIE.
• We present the viability of obtaining the particle size and surface coverage in a monolayer of polystyrene particles adsorbed on a glass surface from optical coherent reflectance data around the critical angle in an internal reflection configuration. We have found that fitting a CSM to optical reflectivity curves in an internal reflection configuration around the critical angle with a dilute random monolayer of particles adsorbed on the surface can in fact provide the particle's radius and surface coverage once the particles are sufficiently large. © 2009 SPIE.

authors

• Alarcón-Oseguera F.
• Castillo Rivera José Juan Francisco
• García-Valenzuela A.
• Peña-Gomar M.C.
• Péreza E.

publication date

• 2009-01-01

published in

• Proceedings of SPIE - The International Society for Optical Engineering  Proceedings

keywords

• Particle adsorption; Reflectance; Scattering measurements; Surface measurements Critical angles; Glass surfaces; Internal reflections; Optical reflectance; Optical reflectivity; Particle adsorption; Polystyrene particle; Reflectance; Reflectance data; Scattering measurements; Surface coverages; Adsorption; Curve fitting; Monolayers; Particle size; Polymer blends; Polystyrenes; Surface measurement; Reflection

Digital Object Identifier (DOI)

• 10.1117/12.839606

start page

end page

volume

• 7386