abstract

• We report the design, fabrication, and characterization of a porous silicon-based omnidirectional mirror for the near infrared range. The structure consists of 300 porous silicon chirped dielectric layers, optimized to have omnidirectional reflectivity response from 1000 to 2000 nm wavelength range. Measurements of reflectivity spectra are presented for non-polarized light at several incident angles (range 8°-65°) with a reflectivity .95%25 covering a 1 μm band-width. Transfer matrix method calculations were carried out to show the complete angular range for both TM and TE polarizations including a simple model to illustrate the interface scattering effects. © 2020 Author(s).

authors

• Agarwal V.
• Amador-Alvarado S.
• Ariza Flores Augusto David
• Chavez-Castillo B.A.
• Madrigal-Melchor J.
• Pérez-Huerta J.S.
• Sustaita-Torres I.A.

publication date

• 2020-01-01

funding provided via

• 1577  Grant
• Consejo Nacional de Ciencia y Tecnología, CONACYT: 256243  Grant

published in

• Journal of Applied Physics  Journal

keywords

• Infrared devices; Mirrors; Reflection; Transfer matrix method; Dielectric layer; Interface scattering; Measurements of; Near-infrared range; Omnidirectional mirrors; Reflectivity spectra; TE polarizations; Wavelength ranges; Porous silicon

Digital Object Identifier (DOI)

• 10.1063/1.5144621

start page

end page

volume

• 127

issue

• 20