Robustness of antenna-coupled distributed bolometers Article

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Overview

abstract

• This Letter shows the effect of the geometrical and material properties of lead lines and connections on the robustness and reliability of optical antennas working as distributed bolometers. We analyze the operational limits of the biasing voltage using a mutiphysics finite element method. We demonstrate that, after evaluating the effect of the electromagnetic irradiance falling on the device, biasing voltage is the main limiting factor to maintain operative titanium optical antennas. Results have been experimentally verified by finding the biasing values needed to destroy optical antennas working as distributed bolometers. Structural damage has been identified from scanning electron microscopy images. © 2013 Optical Society of America.

authors

• Alda J.
• Cuadrado A.
• González Contreras Francisco Javier
• Silva-López M.

publication date

• 2013-01-01

published in

• Optics Letters  Journal

Research

keywords

• Antenna-coupled; Biasing voltages; Operational limits; Optical antennas; Scanning electron microscopy image; Structural damages; Bolometers; Infrared detectors; Optical instruments; Scanning electron microscopy; Structural analysis; Antennas

Identity

Digital Object Identifier (DOI)

• 10.1364/OL.38.003784

Additional Document Info

start page

• 3784

end page

• 3787

volume

• 38

issue

• 19