abstract

• The effect of gradually varying refractive index at each interface of a multilayered porous silicon photonic structure is studied experimentally and theoretically. The variation of refractive index at the interface, between any two consecutive layers, is done in small ladder-like steps (increasing/ decreasing) and the resulting optical properties are compared with the standard structures with the flat interface and similar optical thickness. The proposed structures are proved to be useful in reducing the stress between the layers of high contrast, resulting in the mechanically more stable structures. © 2011 IOP Publishing Ltd.

authors

• Agarwal V.
• Ariza Flores Augusto David
• Gaggero-Sager L.M.

publication date

• 2011-01-01

published in

• Journal of Physics D: Applied Physics  Journal

keywords

• Flat interface; High contrast; Multi-layered; Optical thickness; Resulting optical properties; Silicon photonics; Stable structures; Varying refractive index; Light refraction; Photonic devices; Refractive index; Refractometers; Porous silicon

Digital Object Identifier (DOI)

• 10.1088/0022-3727/44/15/155102

start page

end page

volume

• 44

issue

• 15