selected publications

• article

  • Raman studies of aluminum induced microcrystallization of n Si:H films produced by PECVD.  Thin Solid Films.  445:32-37. 2003-01-01

• conference paper

  • Dependence on the growth direction of the strain in AlGaSb alloys.  Journal of Physics: Conference Series. -. 2009-01-01
  • Raman and FTIR spectroscopy of GaSb and AlxGa1-X alloys with nanometric thickness grown at low temperatures by liquid phase epitaxy.  AIP Conference Proceedings. 1258-1261. 2008-01-01
  • Structural characterization of microcrystalline-amorphous hydrogenated silicon samples prepared by PECVD method.  Proceedings of SPIE - The International Society for Optical Engineering. 1540-1543. 2004-01-01